Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization (In 2 Volumes)

These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.’ Foreword by Leonard C Feldman (Director Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, USA)HighlightsAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.Additional ISBNs9789814322843Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization (In 2 Volumes) is written by Richard Haight, Frances M Ross, and James B Hannon and published by World Scientific. ISBNs for Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization (In 2 Volumes) are 9789814390972, 9814390976 and the print ISBNs are 9789814322805, 9814322806. Additional ISBNs include 9789814322843.