Spatial Point Patterns: Methodology and Applications with R

Modern Statistical Methodology and Software for Analyzing Spatial Point Patterns Spatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data.Making the techniques accessible to non-mathematicians, the authors draw on th Additional ISBNs1482210207, 0429161700, 9781482210200, 9780429161704Spatial Point Patterns: Methodology and Applications with R 1st Edition is written by Adrian Baddeley; Ege Rubak; Rolf Turner and published by Chapman & Hall. ISBNs for Spatial Point Patterns are 9781482210217, 1482210215 and the print ISBNs are 9781482210200, 1482210207. Additional ISBNs include 1482210207, 0429161700, 9781482210200, 9780429161704.